MCR-8000HSERIES LCR METER
- Basic measurement accuracy up to 0.05% (0.1% for DCR testing), test frequency coverage: 20Hz-5MHz
- Can measure various parameters such as |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR
- Supports series/parallel equivalent circuits
- Output impedance supports 30Ω, 100Ω, 10/100, 10/CC
- Built-in DC bias: -5V~+5V (-100mA~+100mA)
- Graphic scanning analysis function, supporting frequency/level/bias scanning to insight into the characteristics of the tested device
Want a custom configuration?
This series offers four output impedance options: 30Ω, 50Ω, 100Ω, and 10/CC. The test signal level covers normal mode and constant level mode, paired with internal DC bias of -5V~+5V (-100mA~+100mA), with optional ±10V (±100mA) DC bias source, adapting to diverse device characteristics. It supports graphical scanning analysis of frequency, level, and bias scanning to intuitively present device characteristics. It has built-in 10-level sorting and level counting functions, as well as open/short/load calibration to ensure measurement accuracy. It has excellent storage and expansion capabilities: internal storage for over 100 groups of parameters, with USB expansion for over 500 groups of parameter files, supporting FAT32 file system, enabling software upgrade and data saving via USB. It has rich interfaces, including standard RS232C, HANDLER, and USB HOST, with optional USB DEVICE, headphone interface, footswitch interface, and GPIB, meeting automated integration and remote control needs, balancing professionalism and ease of use.
| Test frequency | MCR-8100H: 20Hz – 1MHz | MCR-8200H: 20Hz – 2MHz | MCR-8500H: 20Hz – 5MHz (Min. 0.0001Hz step) | |
| Parameter | |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR | |
| Basic accuracy | 0.05%, (0.1% for DCR test) | |
| Measurement | Equivalent circuit | Series & parallel |
| Mathematics function | Absolute deviation, Percentage deviation | |
| Range | Auto, Hold, Manual selection | |
| Trigger mode | INT, MAN, EXT, BUS | |
| Speed (≥1kHz) | FAST: 75 times/second, MED: 12 times/second, SLOW: 3 times/second | |
| Average | 1—255 | |
| Delay Time | 0—60s | |
| Calibration | open / short / load | |
| Test terminal | Five terminal | |
| Features | List scan | 10 point list scanning function |
| Comparative function | Eleven BIN sorting function (BIN1~BIN9, AUX, OUT) | |
| Multi parameter test | Yes | |
| Display mode | Direct, Δ, Δ%, V/I | |
| Test Signal | Output impedance | 30 Ω, 100 Ω, 10 /100, 10 /CC |
| Test level | 5 mV - 2V (Accuracy: 10%, Customizable max 10V) | Constant level: 10 mV - 1 V (Accuracy: 5%) | |
| DC bias source | 0V, 1.5V, 2V (Accuracy: 1%) | |
| Display Range | |Z|, R, X | 0.01mΩ — 99.9999 MΩ |
| DCR | 0.001 mΩ — 99.9999 MΩ | |
| |Y|, G, B | 0.00001µS — 99.9999S | |
| C | 0.00001pF — 9.99999F | |
| L | 0.00001µH — 99.9999kH | |
| D | 0.00001 — 9.99999 | |
| Q | 0.00001 — 9999.99 | |
| θ (DEG) | -179.999º — 179.999º | |
| θ (RAD) | -3.14159 — 3.14159 | |
| Other | Monitor | 800 x 480 RGB, 7 inch LCD TFT display |
| Size | 375mm(W) * 135mm(H) * 350mm(L) | |
| Net weight | About 7.2 kg |